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Live Webinar
Thursday, May 16 at 11:00 a.m. EDT |
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| Solved: The Search for the Single ICP-OES Solution for Environmental Testing |
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Users of analytical technologies in many environmental laboratories have had difficulty finding one instrument to fill all their ICP-OES analysis needs. Instead, they have adopted a variety of approaches to selecting their analytical instrument inventory such as ICP-MS and Axial-View ICP-OES for high sensitivity, and Dual-View.
Users have long sought to reduce some of this complexity and cost. The revolutionary Dual Side-On Interface (DSOI) Technology resolves this challenge.
This novel, vertical torch, triple interface offers multiple benefits for environmental and other industrial sample analysis such as high precision, stability, a factor of two higher sensitivity in radial mode without matrix interferences and interface contamination.
This webinar will introduce attendees to DSOI technology, its benefits and applications.
Key Takeaways:
- Gain insight into the search for a single ICP-OES answer - and the benefits of a solution
- Receive an introduction to this revolutionary new approach to ICP-OES analysis for environmental and industrial sample testing
- Learn how DSOI can offer a factor of two improved sensitivity and detection limits in the analysis of environmental and industrial trace elements
- Compare and contrast DSOI performance versus other ICP-OES analyzers' plasma views
- Learn how new ICP technology can enhance performance, speed of analysis, and save thousands per year on cost
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